Shianling Wu

Instructor in Electrical and Computer Engineering

Office Hours

Monday, Wednesday and Fridays 12:00PM - 1:00PM


Shianling Wu is the Director of the Department of Electrical and Computer Engineering's Professional Science Masters-Computer and Systems Security (PSM-C&S Security) Program, with concentration on the physical and hardware aspects of the Cyber Security paradigm. Her technical expertise is in Electronics Design Automation (EDA) tools for semiconductor Integrated Circuit (IC) Design-for-Test, specializing in Built-in Self-Test for device logic and memories. Her industry experience includes leading and managing R&D teams to build over 15 EDA tools for IC testability and supporting world-wide EDA users. She is also a certified project manager experienced in managing multinational projects. She has 13 patents, 6 journal papers, 21 publications, and 1 book chapter. She is a Senior IEEE member, the recipient of IEEE Meritorious Service Award and a Best Panel Session Award from IEEE International Test Conference (ITC). Representing her companies, she was a member of SEMATECH on Test, ITC Program Committee, and IEEE1500 Standards Committee, a contributor to the Asian Test Symposium, and an industry liaison to the North Atlantic Test Workshop.


  • M.S., Computer Science – Columbia University, School of Engineering and Applied Science
  • B.S., Computer Science – City College of New York, School of Engineering


  • Cyber Security: Technology, Application and Policy, Certificate of Completion – MIT Professional Education
  • Project Management Professional (PMP) Certification – The Project Management Institute®

 Industry Experience

  • VP of Engineering, SynTest Technologies, Inc., Sunnyvale, CA
  • Technical Manager, Bell Laboratories, Hopewell, NJ & Allentown, PA

 Recent Publications

[1]   S. Wu, et al.,“Launch-on-Shift Test Generation for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains,” ACM Transactions on Design Automation of Electronic Systems, Vol. 17, Issue 4, Article No. 48, October 2012. 

[2]   S. Wu, et al., “Physical-Design-Friendly Hierarchical Logic Built-In Self-Test – A Case Study,” Proc. IEEE 2012 International Symposium on Quality Electronic Design (ISQED-2012), Santa Clara, CA, March 2012.

[3]   S. Wu, et al., “Using Launch-on-Capture for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains,” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol. 30, No. 3, pp. 456-463, March 2011.

[4]   S. Wu, et al.,“Architectures for Testing 3D Chips Using Time-Division Demultiplexing/ Multiplexing,” IEEE 3D-TEST Workshop, Anaheim, CA, September 2011.

[5]  S. Wu, et al., “Using Launch-on-Capture for Testing BIST Designs Containing Synchronous and Asynchronous Clock  Domains,” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol.  29, No. 2, pp. 299-312, February 2010.

Recent Patents

[1]   L.-T. Wang, N. A. Touba, M. S. Hsiao, Z. Jiang, S. Wu, Method and apparatus for testing 3D integrated circuits,” United States Patent No. 8,522,096, August 27, 2013.

[2]  L.-T. Wang, S. Wu, Z. Jiang, J. Liu, H.-J. Chao, L. Yu, F. Zhao, F. Li, and J. Yan, “Multiple-Capture DFT System to Reduce Peak Capture Power During Self-Test or Scan-Test,” United States  Patent No. 8,091,002, January 3, 2012.  

[3]   L.-T. Wang, N. A. Touba, Z. Jiang, S. Wu, and R. Apte, “Robust Scan Synthesis for Protecting Soft Errors,” United States Patent Application No. 12,508,977, allowed December 20, 2011.

[4]   N. A. Touba, L.-T. Wang, Z. Jiang, S. Wu, and J. Yan, “Method and Apparatus for Low-Pin Count Scan Compression,” United States Patent No. 7,996,741, August 9, 2011.